Ellipsometry Smart Chart Webinar

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  • Опубліковано 20 вер 2023
  • In this webinar we will focus on Spectroscopic Ellipsometry (SE) which is a powerful analytical tool for the characterization of thin films in many materials, including semiconductors, dielectric films, metals and polymers.
    Find more webinars at www.eag.com/resources/webinars/
    If you have any testing needs please contact us at www.eag.com/contact/
  • Наука та технологія

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