Variable Angle Spectroscopic Ellipsometry

An elipsometer is used measure the dielectric properties (including refractive index and dielectric function) of thin films.
For more information see the photonics wiki:
photonicswiki.org/index.php?ti...

[@user-wu6eq1ty1y]

When you understand the science behind this you really appreciate how amazing and versatile the software is at modelling and fitting the optical parameters and thickness of almost any thin film sample you can throw at it

[@n.k.-vlsi995]

lovely explanation..

[@feliciali7371]

This VASE can also measure anisotropic material, but exactly how?

[@siripongsrisuwan9473]

Hi, Stepahanie
I'm studying in master degree in the Thailand, i interest your VASE because i am doing Ellipsometry technique for measure the thickness of thin film but i not understand values of Phi and Delta , which can be measured from..... ? In your video show that it's measured by the machine (VASE) , What you known that the Phi and Delta can be measured by...?
Thank you
Mr.Siripong from Thailand.

[@navidhott]

Good job...by the way you also looks nice.

[@MohammedIslamElshiekhElsmani]

Interesting!!