Testability of VLSI Lecture 5: Fault Simulation

Fault Simulation, Automatic Test pattern generation, Fault Sensitization, Fault Propagation, Line Justification, Random Test Pattern Generation, Serial Fault Simulation, Advantages, Disadvantages, Inserting Faults, Parallel Fault Simulation, Deductive Fault Simulation, Concurrent Fault Simulation, Roth's Test-Detect Algorithm

[@zn4798]

clear and good explanation, hope you could upload more videos.

[@SanjayVidhyadharan]

Thank you. The series of lectures is avaliable in this link
sanjayvidhyadharan.in/courses/testability-of-vlsi-lecture/

[@zn4798]

What is the text book you are using sir

[@SanjayVidhyadharan]

The references are given in the last slide od ecah lecture
sanjayvidhyadharan.in/courses/testability-of-vlsi-lecture/