Demonstration of Table Top Scanning Electron Microscopy (S.E.M)

A demonstration of Table Top Scanning Electron Microscopy (S.E.M).
The key features of the two systems (EM-40 and EM-30) are as follows. For more information and to request a tailored demonstration to meet your specific needs, please contact us at [e-mail] or visit our website at www.PhaosTech.com.
Key Features:
- High-resolution Tabletop SEM
- Clear images without noise
- Dual display SE and BSE images into 1 view
- Duplex Navi
- Coolstage
- STEM Analysis
- Variable pressure (10, 20, 30Pa)
- Fast frame rate up to 13fps
Other Accessories:
- Ion Sputter Coater
- CP-8000+