Lecture-13|VLSI System Testing|Automatic Test Pattern Generation (ATPG)|D-Algorithm
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- Опубліковано 10 вер 2024
- Subject - VLSI System Testing
Semester - II (M.Tech, Electronics & Telecommunication)
University - Chhattisgarh Swami Vivekanand Technical Univesity (CSVTU), Bhilai.
Topic - Automatic Test Pattern Generation (ATPG)|D-Algorithm
Faculty - Prof. Ashish Tiwari (PhD*, M.tech (VLSI Design), B.E. (Electronics and Telecommunication), Senior Member (IEEE), Life Member (ISTE).
This lecture discusses the automatic test pattern generation methods for combinational circuits. D-algorithm, PODEM, FAN, SOCRATES are popular ATPG schemes. The D-algorithm is discussed in detail here. All other schemes are extension or improvement of D-algorithm.