SEM: Zeiss EVO Scanning Electron Microscope

Zeiss EVO 50 Scanning Electron Microscope
Zeiss EVO 50 SEM can be used for a range of imaging and analytical applications using either a W or LaB6 filament
Large area BSE detector ideal for imaging mineralogical and metallurgical samples
Oxford Instruments AZtec EDS system, with large area X-Max 80mm2 silicon drift EDS detector
Fully automated analytical capability with particle detection ("Feature"), large area imaging and EDS map montaging
Ideal for automated detection of inclusions in steel, heavy minerals in rocks and particle classification in engineering applications
Multi sample stages (5 polished thin sections or 9 epoxy-mounted blocks)
0:00​ - Start Up & Sample Loading
2:46​ - Stage Movement
3:38​ - Turning on the Beam
4:49​ - Brightness & Contrast
5:27​ - Focusing & Working Distance
6:26​ - Gun Alignment
7:06​ - Stigma & Wobble
8:41​ - Capture & Save Images
9:57​ - Shut Down
Australian Centre for Microscopy & Microanalysis
sydney.edu.au/acmm
Would you like to learn how to use EDS on the Zeiss EVO 50 SEM? See part 1 (Point & ID) here: • Video
These videos provide guidance only. Local work health and safety protocols should always take precedence when you undertake any lab procedures in your own facility. Some of the videos show workflows for specific instruments and their content should not be taken as specific instructions for other types of instruments.