SEM: Zeiss Sigma HD Scanning Electron Microscope

Zeiss Sigma HD Scanning Electron Microscope
Schottky field emission gun (FEG) SEM for high resolution imaging equipped with: variable pressure (VP) capability enabling study of non-conductive material, dedicated low kV BSE detector providing TEM quality backscatter electron images, revealing cellular structures in a wide range of life-science samples, STEM detector with brightfield and darkfield imaging, topographic imaging to ~1nm using an in-lens secondary electron detector, compatible for use with correlative microscopy system, Shuttle and Find, integrated Oxford instrument AZtec EDS and EBSD system, with X-Max 20mm2 SDD EDS detector and high speed Nordlys-F+ EBSD detector.
0:00​​ - Start Up & Sample Loading
2:52​​ - Stage Movement
3:54​​ - Turning on the Beam
4:23​​ - Focusing & Working Distance
6:18​ - Stigma & Wobble
7:47​​ - Capture & Save Images
8:17​​ - Shut Down
Australian Centre for Microscopy & Microanalysis
sydney.edu.au/acmm
These videos provide guidance only. Local work health and safety protocols should always take precedence when you undertake any lab procedures in your own facility. Some of the videos show workflows for specific instruments and their content should not be taken as specific instructions for other types of instruments.