Amazing explanations and clarity .. thank you so much for such pattern of teaching complicated topics this... making notes for ur every lecture on electron microscopy and diffraction analysis
The second method is called dirty because it is not the proper way of doing dark field TEM measurements. The proper way is to set up a two-beam condition
![ЛЕБЕДЕВ у ДУДЯ: муху не обманешь 😁 [Пародия]](http://i.ytimg.com/vi/E74h5fvVrqs/mqdefault.jpg)
As someone who is training on a Tecnai Osiris this video was very insightful. Thanks.
Amazing explanations and clarity .. thank you so much for such pattern of teaching complicated topics this... making notes for ur every lecture on electron microscopy and diffraction analysis
You forgot to mention the main role of the strength of the projective lens in "diffraction mode" vs. "imaging mode". That is the key difference.
This is so helpful. Thank you
The second method is called dirty because it is not the proper way of doing dark field TEM measurements. The proper way is to set up a two-beam condition
also, you don´t do dark-field because it is easier to see with a dark background. This video is highly incorrect and misleading. Please remove it