Manipulating Graphene in a hybrid SEM AFM microscope

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  • Опубліковано 30 вер 2024
  • A hybrid SEM / AFM combination (see www.dme-spm.com...) is a fascinating way to directly observe the mechanical deformation of graphene layers when applying controlled forces. The Carl Zeiss MERLIN FE-SEM with the fully integrated AFM Option from DME is a powerful way for investigating mechanical and electrical properties of Graphene.

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