Sir I have doubt do we require device in ON state i.e operating state during this test. Or this tests are performed in OFF state of device. And 2nd question is whether we have to expose directly PCB to the chamber or product should be enclosed i.e complete product with cover and fitments.
Hi Manmohan, Great questions! It depends on the use condition you are trying to simulate which will drive the operating state. Typically for a field operation test, the device will be in its ON operating state. If you are simulating a storage or transport test than typically the device in be OFF or non operational. Whether you test a separate part such as a PCB or an entire system only will depend on what your technical specifications define for the all materials and parts within your system. There are JEDEC tests such as 85/85 testing that test an individual component that would be mounted on to a PCB. The granularity and how deep into the system you get for testing depends on your technical specifications or requirements in summary. I suggest purchasing components or PCBs from suppliers who already have reliability data for the tests requirements you have for a subsystem part or component for your device and testing at the enclosed, system level at your company. Let me know if this answers your question.
@@tomreshtesting Thanks for this video, this is really helpful. I guess related for electronics, we can keep power up as well as measure intermittently. as failure due to ingress of moisture will not be detected unless we test it. please correct my understanding. 85C/85%, 1000 hours test, does it fall under the high temp high humidity or long term reliability testing? I have difficulty in interpreting these test hours into life of the product. Can you guide me on this little. what I understand from reference paper that this was not calculated from acceleration model, but more for covering different combinations of humidity and temperature. and different models were tried to fit that data. also these were initially developed to test epoxy. but how do we relate this to new IC packaging now. not sure if I could convey the question clearly.
How to estimate product testing for a specified number of years. For example, testing an electronic device exposed to nature for a year and how to simulate it for a shorter period.
Sir, Thank you very much for you lessons, very informative. BTY, I'm very interested in Static Discharge Test that you mentioned and the possible failure mode that might come with it. Hope you could share a litte more with us; THANKS A LOT;
Sir I have doubt do we require device in ON state i.e operating state during this test. Or this tests are performed in OFF state of device. And 2nd question is whether we have to expose directly PCB to the chamber or product should be enclosed i.e complete product with cover and fitments.
Hi Manmohan,
Great questions!
It depends on the use condition you are trying to simulate which will drive the operating state. Typically for a field operation test, the device will be in its ON operating state.
If you are simulating a storage or transport test than typically the device in be OFF or non operational.
Whether you test a separate part such as a PCB or an entire system only will depend on what your technical specifications define for the all materials and parts within your system. There are JEDEC tests such as 85/85 testing that test an individual component that would be mounted on to a PCB.
The granularity and how deep into the system you get for testing depends on your technical specifications or requirements in summary.
I suggest purchasing components or PCBs from suppliers who already have reliability data for the tests requirements you have for a subsystem part or component for your device and testing at the enclosed, system level at your company.
Let me know if this answers your question.
@@tomreshtesting
Thanks for this video, this is really helpful.
I guess related for electronics, we can keep power up as well as measure intermittently. as failure due to ingress of moisture will not be detected unless we test it. please correct my understanding.
85C/85%, 1000 hours test, does it fall under the high temp high humidity or long term reliability testing? I have difficulty in interpreting these test hours into life of the product. Can you guide me on this little. what I understand from reference paper that this was not calculated from acceleration model, but more for covering different combinations of humidity and temperature. and different models were tried to fit that data. also these were initially developed to test epoxy. but how do we relate this to new IC packaging now.
not sure if I could convey the question clearly.
Great explanation. Very simple to understand.
How to estimate product testing for a specified number of years. For example, testing an electronic device exposed to nature for a year and how to simulate it for a shorter period.
Great question. I cover this in my other video on accelerated life testing, which you can find on my channel. Thanks!
Cool educational video
Very Helpful. Thank you!
Thank you
Very good
Sir, Thank you very much for you lessons, very informative.
BTY, I'm very interested in Static Discharge Test that you mentioned and the possible failure mode that might come with it. Hope you could share a litte more with us;
THANKS A LOT;
OK
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