Park NX20 - The leading nano metrology tool for failure analysis and large sample research

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  • Опубліковано 19 вер 2024
  • As an FA engineer, you’re expected to deliver results. There’s no room for error in the data provided by your instruments. Park NX20, with its reputation as the world’s most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
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    #atomicforcemicroscopy #Parksystems #AFM

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