Triple ion beam polishing a concrete cross-section

Here we are performing a final polish of a cut and mechanically polished concrete cross-section using the TIC3X triple beam ion mill. This produces a superior finish for materials analysis by SEM-EDX, especially for enhanced contrast in back-scattered electron imaging and X-ray analysis.
The sample is continuously rotated and shifted over the course of the polish (~30 minutes) to provide an even surface finish.