Scanning Tunneling Microscope | STM | SPM : Part-2 | Semicondcutor Characterization | Academic Talks

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  • Опубліковано 18 вер 2024
  • This video lecture describes the 'Scanning Tunneling Microscope' i.e STM, used for characterization of semicondcutors materials.
    #STM
    #Academictalks
    #semiconductor
    #characterization

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