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Eyring Materials Center
United States
Приєднався 9 бер 2016
Instrument training videos for the Eyring Materials Center instruments. #EyringCenter
Rigaku SmartLab training video to so GXRD and XRR.
Video showing how to use SmartLab Studio II to measure grazing incidence X-ray diffraction and x-ray reflectivity on thin film samples.
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Відео
Using the PerkinElmer Frontier FTIR with the Pike Diamond ATR
Переглядів 699Рік тому
Training video to measure powders and liquids on the diamond ATR with the Frontier FTIR instrument. For more info on our instrument check out our website here: cores.research.asu.edu/materials/equipment/FTIR
Helios 5UX - SEM training video
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Training video for our Thermo Fisher Scientific Helios 5UX dual beam FIB/SEM This video only covers the basic SEM aspect of the microscope. For more information about the instrument, please see our website: cores.research.asu.edu/materials/equipment/semfib-focused-ion-beam-helios-5-ux-thermoscientific related video: ua-cam.com/video/WrxZ3k8i7uM/v-deo.html
Helios 5UX - FIB training
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Training video for our Thermo Fisher Scientific Helios 5UX dual beam FIB/SEM This video only covers the FIB aspect of the microscope. for more information about the instrument, please see our website: cores.research.asu.edu/materials/equipment/semfib-focused-ion-beam-helios-5-ux-thermoscientific Related video: ua-cam.com/video/kngtBYSN2Q4/v-deo.html
J A Woolam M2000 Ellipsometer highlight video
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The ASU Core Research Facilities are proud to introduce the J.A. Woollam M2000 Spectroscopic Ellipsometer, a cutting-edge instrument revolutionizing thin film measurement on wafers. With the M2000, researchers can accurately determine the thickness of thin films and even obtain the complex refractive index of dielectric films. Its advanced capabilities extend to fitting multiple layers in a sta...
FEI TEM holder insertion and removal training.
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This training video describes inserting and removing a TEM holder from a FEI / Thermo Fisher Scientific TEM. We also emphasize a few elements to help you avoid crashing the microscope vacuum.
Nion ultra STEM 100 training video.
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Introductory training video for our NION ultra STEM 100 Scanning Transmission Electron Microscope.
ASU Core Facilities Equipment Showcase: Talos L120C
Переглядів 286Рік тому
The ASU Core Research Facilities house state-of-the-art equipment, including including the Talos L120C transmission electron microscope. This instrument images both negatively stained or resin biological samples at accelerating voltages of either 80 or 120 kV. The Talos is capable of long-term data collection, such as Serial EM, because of its large liquid nitrogen dewar. As a research institut...
Zeiss Auriga SEM training video
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Training video for our Zeiss Auriga dual beam FIB/SEM. The video covers basic SEM operations from sample loading to image optimization. For more info on our instrument, check our website: cores.research.asu.edu/materials/equipment/semfib-focussed-ion-beam-auriga-zeiss
Ion beam accelerator highlight Video
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Video highlighting our 1.7 MeV tandem accelerator and analysis chamber where thin film samples can be analyzed using Rutherford Backscattering and other techniques. More information here: cores.research.asu.edu/materials/equipment/ion-beam-analysis-materials-ibeam
Eyring Materials Center Kratos axis supra+ instrument highlight
Переглядів 146Рік тому
Our Kratos Axis supra is a state-of-the-art X-ray photoelectron spectroscopy (XPS) instrument with UPS, ISS measurement capabilities, and an argon cluster gun for gentle sample cleaning and depth profiling. More information here: cores.research.asu.edu/materials/equipment/x-ray-photoelectron-spectroscopy
ARM200F sTEM training video
Переглядів 3,5 тис.2 роки тому
STEM imaging on ASU's probe corrected ARM200F training video. The video is for basic imaging. More information here: cores.research.asu.edu/materials/equipment/temstem-arm200f-jeol
XPS presentation Guo 04 01 2022
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Introduction to XPS and our new Kratos Axis Supra instrument.
Bruker IFS 66V/S FTIR training
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Training video describing how to operate the Bruker IFS66V/S FTIR system with the diamond ATR module. For information about the facilities provided by Arizona State University's Eyring Materials Center (EMC), please visit: cores.research.asu.edu/materials/about For information specific to the EMC's Fourier-transform infrared spectroscopy (FTIR) capabilities, please visit: cores.research.asu.edu...
Using the Lambda 950 UV-vis spectrometer to analyze small samples - updated
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A companion to our Lambda 950 training video (ua-cam.com/video/8tGhqVwi-Qc/v-deo.html ) aimed at helping to analyze small samples on the Lambda 950 in both transmission and reflectance mode. For information about the facilities provided by Arizona State University's Eyring Materials Center (EMC), please visit: cores.research.asu.edu/materials/about For more information on the EMC's UV-Vis spect...
Helios 5 UX capabilities Highlight video
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Helios 5 UX capabilities Highlight video
ASU's eTEM Titan Microscope: Even more powerful with a new GIF and K3 direct electron detector
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ASU's eTEM Titan Microscope: Even more powerful with a new GIF and K3 direct electron detector
ASU's Nion Microscope: Even more powerful with a new electron detector
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ASU's Nion Microscope: Even more powerful with a new electron detector
Practical introduction to X-ray diffraction - high resolution XRD - video 3 of 4
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Practical introduction to X-ray diffraction - high resolution XRD - video 3 of 4
Practical introduction to X-ray diffraction - Powder diffraction - video 2 of 4
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Practical introduction to X-ray diffraction - Powder diffraction - video 2 of 4
Practical introduction to X-ray diffraction - Introduction - video 1 of 4
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Practical introduction to X-ray diffraction - Introduction - video 1 of 4
Setaram Labsys EVO (DTA mode) training video
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Setaram Labsys EVO (DTA mode) training video
Mounting powder and solid sample in Malvern-PANalytical Aeris autoloader sample holder
Переглядів 1,5 тис.4 роки тому
Mounting powder and solid sample in Malvern-PANalytical Aeris autoloader sample holder
PerkinElmer Frontier FTIR training video
Переглядів 9 тис.4 роки тому
PerkinElmer Frontier FTIR training video
This was so helpful thank you so much. We have the Alpha 300RA and I didn't know how to properly use the True surface feature. Will try on our samples and see if I will manage
b( ̄▽ ̄)d
Nah, sample thread could introduce a trapped volume.
Can you record the sample thru a given time period and how does this machine compare to the U of A new electron microscope?
if your question is about whether we can record "movies," the answer is yes. The new microscope at UofA is the Hitachi HF5000 - 200KeV aberration-corrected TEM, right? So, the only similarity is that both machines are probe-corrected STEM. The rest, from the manufacturer, are entirely different regarding stability, working voltages, EDS, and EELS capabilities. If you have more questions, please contact me at mroldang@asu.edu. Thanks.
Hi how we can process the data on open free source software for this instruments
where is the thickness value of the film from the data analysis?
amazing video, thank you so much really
Thanks very good
Do u know ABF ?
Hi, thanks for the visit and question. And yes, ABF is available at this equipment at ASU. Thanks.
@@marolgu Do you use beam stopper and STEM aperture 3mm to act as ABF?
Crystally clear explanations. Thank you!
Thanks for the video! When you were measuring the reflectance, what is there in the 2 holders you are refering to as the reference and the sample? What is the chemical composition on them? Also, is it not necessary to run any baseline scan for this reflectance mode? Does it not have anything to do with the BaSO4 baseline?
We use a spectralon 99% reference on our instrument. Spectralon are calibrated references made of teflon. I have not used BaSO4 for baseline. If you are interested I see an interesting comparizon between references here: www.shimadzu.com/an/sites/shimadzu.com.an/files/pim/pim_document_file/applications/application_note/13902/a639_e.pdf
@@EyringMaterialsCenter Thank you very much. Have a nice day
Thank you! Great video!
HELPFUL and INSTRUCTIVE!
Why I can't find the integral gain and the proportional gain parameter ? (I use the mechanical properties mode)
Hi. If you are using Any Peak Force mode, the gains are being set automatically as you scan. In tapping mode they will appear on the Scan Parameters list of values to change.
@@EyringMaterialsCenter Thank you so much. 😃
I would like to ask, is there any need to change the drive amplitude and amplitude set point when using tapping mode? I am quite new to AFM. I normally change these parameters but cannot seem to get consistent images most of the time. This is the first guide I've seen in which these parameters were not changed.
Typically, you can set it and forget it! When using tapping mode, the setpoint can be decreased on samples that require greater tapping force. If your probe is tending to come off the sample surface, you should increase the tapping force. Also, make sure you're using the best probe for the sample.
@@EyringMaterialsCenter So Ideally, I can match the trace and retrace by changing the proportional and integral gains as pointed out in the video?
@@darylldalayoan4880 yes that is the goal to get good images.
Alhamdulillah
Do we need to enter the value of omega offset in the Sample offsets field under User Settings tab before starting the gonio scan?
Hi Sandeep, unless the offset is large I would not worry about entering a sample offset.
sir how to calculate lattice parameter of composite film Polyvinyl Achohol (PVA)-LaFeO3 with different concentrations
What are the dimensions of the container for the aerosol sample?
The standard TEM grid has a size of 3 mm in diameter.
How long does it take to take a photo with an ETEM microscope? What if it is an aerosol sample? How to prepare an aerosol sample? How do you get an aerosol sample into a cell?
Many thanks for your questions. Sample preparation is an important part of the microscopy experiments. 1. How long does it take to take a photo with an ETEM microscope? With you sample on a TEM grid, a photo can be taken within half an hour for sample loading and basic equipment check up. Then a single image only takes a few minutes to collect and record. 2. What if it is an aerosol sample? There is not much difference as long as your sample is on a standard TEM grid. 3. How to prepare an aerosol sample? Aerosol sample has to be collected in some way, say, on a filter paper. Then the sample can be moved from the filter paper to a TEM grid. You should search literature to find out the best procedure for this. 4. How do you get an aerosol sample into a cell? I am not quite sure about the "cell" you are talking about. You can send me an email to discuss about details.
Thanks for this video. It helped me a lot. I would also like to see training videos on Witech AFM and Confocal microscopy.
Great, thanks
As per you the system without ATR can solve the problem of checking transmission of germanium,silicon window.
All you would need to do is place the window in the beam path during the measurement. No special accessory is needed.
is ATR necessary for checking of transmission of germanium or silicon window?
It is not recommended. A straight-through transmission if preferred. The ATR would only provide information about the surface of the material being analyzed.
Thankyou
how we check the transmissiin of ir coatrd windows made of germanium , silicon,etc
Hi Manan, assuming the window is transparent enough, which should be the case, you can do a straight through measurement by mounting the window on the steel holder shown around 1:33 on the video. You can use tape to mount the sample as long as the beam does not go through the tape.
@@EyringMaterialsCenter is ATR required for this?
@@manojdhiman5694 I would not use the ATR for it unless you are only interested in analyzing the coating.
Good topics
Kindly upload a alignment video
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How to align the device, one video tutorial please
thank you very much
It is a great video training . ^^ We are SEC Europe Head Office. -tabletopsem -Tischrem - Nanotech digital GmbH (SEC Europe) www.nanotechdigitalgmbh.com
Thanks a lot for this helpful video. Keep up the good work.
Hello, how can I get User name and password for Perkinelmer. I already used administrator but it's not working
Hi Roman, The system owner should have access to doing that. Otherwise, I would suggest contacting PerkinElmer's customer service. Good luck!
Hello, could you make a video on data analysis on emissions/how to read on the Spectrum software? Thanks
Hi, Thank you for your interest. The proposed video is not currently on our list but it is an excellent idea and I will definitely keep it in mind for future videos.
This is really helpful. Do you have any tips that can be followed to focus the instrument? I face hard time when i start that focus step. Thanks.
Hi Partho, It is always a good idea to check where the laser spot is in relation to the white light coming from the camera before you insert your sample or probe. Using a white strip of paper, place it in the optical head just above the probe holder. It should be just to the left of or near center. The white light is your general field of view, FOV, when observing the live image on the software "Setup" screen. If you insert a very reflective sample, such as a smooth metal like gold, you can then direct the laser spot to the end of your cantilever. Make certain your probe is in the FOV, then focus on the reflective sample. Sometimes bringing the probe close to the surface of the sample will help in seeing the laser spot. Then watch the SUM. It should increase as the reflection of the laser hits the position sensitive detector. If you continue to have issues, feel free to connect with me on Zoom. I will be happy to walk you through the process. Best regards, Diana
@@dianaconvey4527 Thank You very much !
Great explanation and very straightforward!
Nice. Very useful
please how to determine the crystal structure of the sample from High Score?
Hi, thank you for your nice video, it's very helpful. I just wanna ask , if I wanna take blank sample (ITO glass) so where is the place for blank sample?
Luthfiyah, if I understand you correctly, I believe you are asking where to put a reference sample. The reference port is located on the front side of the integrating sphere. In the video you might notice there is a reference standard used on that port when a reference sample is not used. I hope this answers your question. ~Diana
Hi, is it possible to measure the absolute optical power or intensity of the light falling on the sample in Lambda 950,?.
Hi Neethu, The system is a dual beam instrument comparing the intensity between the 2 beams so there is no absolute measurement of the intensity only a relative one.
Strain and size analysis?
Odebowale I suggest checking out the information at J.A. Woollam's website. They have a very nice tutorial and offer classes on data analysis. Good luck
reaally enjoy the video. can you please send me reference material on WVASE Ellipsometry dataanalysis
im having having a hard time to interpret the results i got from XRD analysis. Please any help!
Hi Sir a useful video but i face some problems in my High plus software before i used it for many analysis but now as i did all of the step finally after selecting the target elements in the periodic table and click search so a message appear that no candidate found so plz tell me that what i should do, i reinstall but still not ok.
I see that you saw my response below. You might need to contact PANalytical for help they have excellent customer service.
how much is it ?
I do not have the current price. Please contact the PANalytical sales office for pricing information.
how much was it ?
Hi, how are u? when I choose some possible elements and click search, I get this message: No candidates found. What is the problem?
The issure can be a number of things. Make sure you have the PDF database on the computer you are using. If you are unsure of the elements present make sure they are selected in grey rather than green.
hi hasti have you solve the problem? i have the same problem as yours? by using the software ?
Hi thanks for your answer. I still have the same problem. I have PDF file on the the computer and I have imported them correctly because I can see the number of patterns which is a big one. but I still receive the same msg although I am sure about my the elements I chose
Hi how are u? I still have this problem:( did u find anything to solve it? let me know please and I will let you know too thanks
how to download this software, i am searched it so many time in google but it is not available trial version also.. kindly help me... my email id is ns.rathinonly4u@gmail.com
Hi Naresh, Please contact PANalytical, this program is sold by them.
how to download PANalytical X'Pert HighScore Plus? thanks
HighScore Plus must be purchased from PANalytical.