Eyring Materials Center
Eyring Materials Center
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Rigaku SmartLab training video to so GXRD and XRR.
Video showing how to use SmartLab Studio II to measure grazing incidence X-ray diffraction and x-ray reflectivity on thin film samples.
Переглядів: 1 693

Відео

Using the PerkinElmer Frontier FTIR with the Pike Diamond ATR
Переглядів 568Рік тому
Training video to measure powders and liquids on the diamond ATR with the Frontier FTIR instrument. For more info on our instrument check out our website here: cores.research.asu.edu/materials/equipment/FTIR
Helios 5UX - SEM training video
Переглядів 866Рік тому
Training video for our Thermo Fisher Scientific Helios 5UX dual beam FIB/SEM This video only covers the basic SEM aspect of the microscope. For more information about the instrument, please see our website: cores.research.asu.edu/materials/equipment/semfib-focused-ion-beam-helios-5-ux-thermoscientific related video: ua-cam.com/video/WrxZ3k8i7uM/v-deo.html
Helios 5UX - FIB training
Переглядів 1,4 тис.Рік тому
Training video for our Thermo Fisher Scientific Helios 5UX dual beam FIB/SEM This video only covers the FIB aspect of the microscope. for more information about the instrument, please see our website: cores.research.asu.edu/materials/equipment/semfib-focused-ion-beam-helios-5-ux-thermoscientific Related video: ua-cam.com/video/kngtBYSN2Q4/v-deo.html
J A Woolam M2000 Ellipsometer highlight video
Переглядів 385Рік тому
The ASU Core Research Facilities are proud to introduce the J.A. Woollam M2000 Spectroscopic Ellipsometer, a cutting-edge instrument revolutionizing thin film measurement on wafers. With the M2000, researchers can accurately determine the thickness of thin films and even obtain the complex refractive index of dielectric films. Its advanced capabilities extend to fitting multiple layers in a sta...
FEI TEM holder insertion and removal training.
Переглядів 290Рік тому
This training video describes inserting and removing a TEM holder from a FEI / Thermo Fisher Scientific TEM. We also emphasize a few elements to help you avoid crashing the microscope vacuum.
Nion ultra STEM 100 training video.
Переглядів 531Рік тому
Introductory training video for our NION ultra STEM 100 Scanning Transmission Electron Microscope.
ASU Core Facilities Equipment Showcase: Talos L120C
Переглядів 250Рік тому
The ASU Core Research Facilities house state-of-the-art equipment, including including the Talos L120C transmission electron microscope. This instrument images both negatively stained or resin biological samples at accelerating voltages of either 80 or 120 kV. The Talos is capable of long-term data collection, such as Serial EM, because of its large liquid nitrogen dewar. As a research institut...
Zeiss Auriga SEM training video
Переглядів 2,7 тис.Рік тому
Training video for our Zeiss Auriga dual beam FIB/SEM. The video covers basic SEM operations from sample loading to image optimization. For more info on our instrument, check our website: cores.research.asu.edu/materials/equipment/semfib-focussed-ion-beam-auriga-zeiss
Ion beam accelerator highlight Video
Переглядів 1,5 тис.Рік тому
Video highlighting our 1.7 MeV tandem accelerator and analysis chamber where thin film samples can be analyzed using Rutherford Backscattering and other techniques. More information here: cores.research.asu.edu/materials/equipment/ion-beam-analysis-materials-ibeam
Eyring Materials Center Kratos axis supra+ instrument highlight
Переглядів 121Рік тому
Our Kratos Axis supra is a state-of-the-art X-ray photoelectron spectroscopy (XPS) instrument with UPS, ISS measurement capabilities, and an argon cluster gun for gentle sample cleaning and depth profiling. More information here: cores.research.asu.edu/materials/equipment/x-ray-photoelectron-spectroscopy
ARM200F sTEM training video
Переглядів 3,1 тис.2 роки тому
STEM imaging on ASU's probe corrected ARM200F training video. The video is for basic imaging. More information here: cores.research.asu.edu/materials/equipment/temstem-arm200f-jeol
XPS presentation Guo 04 01 2022
Переглядів 4502 роки тому
Introduction to XPS and our new Kratos Axis Supra instrument.
Bruker IFS 66V/S FTIR training
Переглядів 6202 роки тому
Training video describing how to operate the Bruker IFS66V/S FTIR system with the diamond ATR module. For information about the facilities provided by Arizona State University's Eyring Materials Center (EMC), please visit: cores.research.asu.edu/materials/about For information specific to the EMC's Fourier-transform infrared spectroscopy (FTIR) capabilities, please visit: cores.research.asu.edu...
Using the Lambda 950 UV-vis spectrometer to analyze small samples - updated
Переглядів 1,5 тис.2 роки тому
A companion to our Lambda 950 training video (ua-cam.com/video/8tGhqVwi-Qc/v-deo.html ) aimed at helping to analyze small samples on the Lambda 950 in both transmission and reflectance mode. For information about the facilities provided by Arizona State University's Eyring Materials Center (EMC), please visit: cores.research.asu.edu/materials/about For more information on the EMC's UV-Vis spect...
Helios 5 UX capabilities Highlight video
Переглядів 6622 роки тому
Helios 5 UX capabilities Highlight video
ASU's eTEM Titan Microscope: Even more powerful with a new GIF and K3 direct electron detector
Переглядів 4102 роки тому
ASU's eTEM Titan Microscope: Even more powerful with a new GIF and K3 direct electron detector
ASU's Nion Microscope: Even more powerful with a new electron detector
Переглядів 6182 роки тому
ASU's Nion Microscope: Even more powerful with a new electron detector
Helios 5 UX FIB/SEM Launch
Переглядів 2,5 тис.3 роки тому
Helios 5 UX FIB/SEM Launch
Practical introduction to X-ray diffraction - high resolution XRD - video 3 of 4
Переглядів 2,8 тис.3 роки тому
Practical introduction to X-ray diffraction - high resolution XRD - video 3 of 4
Practical introduction to X-ray diffraction - Powder diffraction - video 2 of 4
Переглядів 1,9 тис.3 роки тому
Practical introduction to X-ray diffraction - Powder diffraction - video 2 of 4
Practical introduction to X-ray diffraction - Introduction - video 1 of 4
Переглядів 5733 роки тому
Practical introduction to X-ray diffraction - Introduction - video 1 of 4
Bruker MM8 alignment tips
Переглядів 3643 роки тому
Bruker MM8 alignment tips
Setaram Labsys EVO (DTA mode) training video
Переглядів 2,9 тис.4 роки тому
Setaram Labsys EVO (DTA mode) training video
XL30 training video supplemental
Переглядів 1274 роки тому
XL30 training video supplemental
Multimode 8 AFM training video
Переглядів 3,7 тис.4 роки тому
Multimode 8 AFM training video
Mounting powder and solid sample in Malvern-PANalytical Aeris autoloader sample holder
Переглядів 1,4 тис.4 роки тому
Mounting powder and solid sample in Malvern-PANalytical Aeris autoloader sample holder
PerkinElmer Frontier FTIR training video
Переглядів 9 тис.4 роки тому
PerkinElmer Frontier FTIR training video
Raman Spectroscopy Highlight Video
Переглядів 3874 роки тому
Raman Spectroscopy Highlight Video
XRT highlight video
Переглядів 1,4 тис.4 роки тому
XRT highlight video

КОМЕНТАРІ

  • @andymouse
    @andymouse День тому

    Nah, sample thread could introduce a trapped volume.

  • @ronrouyer2069
    @ronrouyer2069 14 днів тому

    Can you record the sample thru a given time period and how does this machine compare to the U of A new electron microscope?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 6 днів тому

      if your question is about whether we can record "movies," the answer is yes. The new microscope at UofA is the Hitachi HF5000 - 200KeV aberration-corrected TEM, right? So, the only similarity is that both machines are probe-corrected STEM. The rest, from the manufacturer, are entirely different regarding stability, working voltages, EDS, and EELS capabilities. If you have more questions, please contact me at mroldang@asu.edu. Thanks.

  • @VINAYSAINI
    @VINAYSAINI 3 місяці тому

    Hi how we can process the data on open free source software for this instruments

  • @dhonnyavvianz4331
    @dhonnyavvianz4331 5 місяців тому

    where is the thickness value of the film from the data analysis?

  • @mirib2660
    @mirib2660 7 місяців тому

    amazing video, thank you so much really

  • @zekiadam
    @zekiadam 11 місяців тому

    Thanks very good

  • @rayshen9739
    @rayshen9739 Рік тому

    Do u know ABF ?

    • @marolgu
      @marolgu Рік тому

      Hi, thanks for the visit and question. And yes, ABF is available at this equipment at ASU. Thanks.

    • @rayshen9739
      @rayshen9739 Рік тому

      @@marolgu Do you use beam stopper and STEM aperture 3mm to act as ABF?

  • @DaiMingTang
    @DaiMingTang Рік тому

    Crystally clear explanations. Thank you!

  • @mahmoudsorour2028
    @mahmoudsorour2028 Рік тому

    Thanks for the video! When you were measuring the reflectance, what is there in the 2 holders you are refering to as the reference and the sample? What is the chemical composition on them? Also, is it not necessary to run any baseline scan for this reflectance mode? Does it not have anything to do with the BaSO4 baseline?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter Рік тому

      We use a spectralon 99% reference on our instrument. Spectralon are calibrated references made of teflon. I have not used BaSO4 for baseline. If you are interested I see an interesting comparizon between references here: www.shimadzu.com/an/sites/shimadzu.com.an/files/pim/pim_document_file/applications/application_note/13902/a639_e.pdf

    • @mahmoudsorour2028
      @mahmoudsorour2028 Рік тому

      @@EyringMaterialsCenter Thank you very much. Have a nice day

  • @TheMiminad
    @TheMiminad Рік тому

    Thank you! Great video!

  • @qingguobai5775
    @qingguobai5775 2 роки тому

    HELPFUL and INSTRUCTIVE!

  • @CherryWang159
    @CherryWang159 2 роки тому

    Why I can't find the integral gain and the proportional gain parameter ? (I use the mechanical properties mode)

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 2 роки тому

      Hi. If you are using Any Peak Force mode, the gains are being set automatically as you scan. In tapping mode they will appear on the Scan Parameters list of values to change.

    • @CherryWang159
      @CherryWang159 2 роки тому

      @@EyringMaterialsCenter Thank you so much. 😃

  • @darylldalayoan4880
    @darylldalayoan4880 2 роки тому

    I would like to ask, is there any need to change the drive amplitude and amplitude set point when using tapping mode? I am quite new to AFM. I normally change these parameters but cannot seem to get consistent images most of the time. This is the first guide I've seen in which these parameters were not changed.

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 2 роки тому

      Typically, you can set it and forget it! When using tapping mode, the setpoint can be decreased on samples that require greater tapping force. If your probe is tending to come off the sample surface, you should increase the tapping force. Also, make sure you're using the best probe for the sample.

    • @darylldalayoan4880
      @darylldalayoan4880 2 роки тому

      @@EyringMaterialsCenter So Ideally, I can match the trace and retrace by changing the proportional and integral gains as pointed out in the video?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 2 роки тому

      @@darylldalayoan4880 yes that is the goal to get good images.

  • @infinitesolutions2602
    @infinitesolutions2602 2 роки тому

    Alhamdulillah

  • @Sandeep-xm1zt
    @Sandeep-xm1zt 2 роки тому

    Do we need to enter the value of omega offset in the Sample offsets field under User Settings tab before starting the gonio scan?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 2 роки тому

      Hi Sandeep, unless the offset is large I would not worry about entering a sample offset.

  • @faheemwani1996
    @faheemwani1996 2 роки тому

    sir how to calculate lattice parameter of composite film Polyvinyl Achohol (PVA)-LaFeO3 with different concentrations

  • @shirinmohammadian9219
    @shirinmohammadian9219 2 роки тому

    What are the dimensions of the container for the aerosol sample?

    • @shizeyang3785
      @shizeyang3785 2 роки тому

      The standard TEM grid has a size of 3 mm in diameter.

  • @shirinmohammadian9219
    @shirinmohammadian9219 2 роки тому

    How long does it take to take a photo with an ETEM microscope? What if it is an aerosol sample? How to prepare an aerosol sample? How do you get an aerosol sample into a cell?

    • @shizeyang3785
      @shizeyang3785 2 роки тому

      Many thanks for your questions. Sample preparation is an important part of the microscopy experiments. 1. How long does it take to take a photo with an ETEM microscope? With you sample on a TEM grid, a photo can be taken within half an hour for sample loading and basic equipment check up. Then a single image only takes a few minutes to collect and record. 2. What if it is an aerosol sample? There is not much difference as long as your sample is on a standard TEM grid. 3. How to prepare an aerosol sample? Aerosol sample has to be collected in some way, say, on a filter paper. Then the sample can be moved from the filter paper to a TEM grid. You should search literature to find out the best procedure for this. 4. How do you get an aerosol sample into a cell? I am not quite sure about the "cell" you are talking about. You can send me an email to discuss about details.

  • @75rock47
    @75rock47 3 роки тому

    Thanks for this video. It helped me a lot. I would also like to see training videos on Witech AFM and Confocal microscopy.

  • @amrmahmoud7231
    @amrmahmoud7231 3 роки тому

    Great, thanks

  • @manojdhiman5694
    @manojdhiman5694 3 роки тому

    As per you the system without ATR can solve the problem of checking transmission of germanium,silicon window.

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 3 роки тому

      All you would need to do is place the window in the beam path during the measurement. No special accessory is needed.

  • @manojdhiman5694
    @manojdhiman5694 3 роки тому

    is ATR necessary for checking of transmission of germanium or silicon window?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 3 роки тому

      It is not recommended. A straight-through transmission if preferred. The ATR would only provide information about the surface of the material being analyzed.

    • @manojdhiman5694
      @manojdhiman5694 3 роки тому

      Thankyou

  • @manojdhiman5694
    @manojdhiman5694 3 роки тому

    how we check the transmissiin of ir coatrd windows made of germanium , silicon,etc

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 3 роки тому

      Hi Manan, assuming the window is transparent enough, which should be the case, you can do a straight through measurement by mounting the window on the steel holder shown around 1:33 on the video. You can use tape to mount the sample as long as the beam does not go through the tape.

    • @manojdhiman5694
      @manojdhiman5694 3 роки тому

      @@EyringMaterialsCenter is ATR required for this?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 3 роки тому

      @@manojdhiman5694 I would not use the ATR for it unless you are only interested in analyzing the coating.

  • @ammai_kollo
    @ammai_kollo 3 роки тому

    Good topics

  • @soogy2senk
    @soogy2senk 3 роки тому

    Kindly upload a alignment video

  • @YYJung-dc6wt
    @YYJung-dc6wt 3 роки тому

    SEC Tabletop SEM SNE 4500 Series are most functionalized and high resolution mode in tabletop series. 5nm Resolution and 150.000 X Actual Magnification and strong at outside vibration factors. It is a easiest operation and multi user adaptable models in Tabletop SEM. #SEc Europe #Tabletopsem #www.tabletopsem.com

  • @soogy2senk
    @soogy2senk 3 роки тому

    How to align the device, one video tutorial please

  • @harouacheali2714
    @harouacheali2714 3 роки тому

    thank you very much

  • @nanotechdigital5209
    @nanotechdigital5209 3 роки тому

    It is a great video training . ^^ We are SEC Europe Head Office. -tabletopsem -Tischrem - Nanotech digital GmbH (SEC Europe) www.nanotechdigitalgmbh.com

  • @zahidurrahaman428
    @zahidurrahaman428 3 роки тому

    Thanks a lot for this helpful video. Keep up the good work.

  • @romanazady7891
    @romanazady7891 4 роки тому

    Hello, how can I get User name and password for Perkinelmer. I already used administrator but it's not working

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 4 роки тому

      Hi Roman, The system owner should have access to doing that. Otherwise, I would suggest contacting PerkinElmer's customer service. Good luck!

  • @yeongjia8
    @yeongjia8 4 роки тому

    Hello, could you make a video on data analysis on emissions/how to read on the Spectrum software? Thanks

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 4 роки тому

      Hi, Thank you for your interest. The proposed video is not currently on our list but it is an excellent idea and I will definitely keep it in mind for future videos.

  • @parthodas4219
    @parthodas4219 4 роки тому

    This is really helpful. Do you have any tips that can be followed to focus the instrument? I face hard time when i start that focus step. Thanks.

    • @dianaconvey4527
      @dianaconvey4527 4 роки тому

      Hi Partho, It is always a good idea to check where the laser spot is in relation to the white light coming from the camera before you insert your sample or probe. Using a white strip of paper, place it in the optical head just above the probe holder. It should be just to the left of or near center. The white light is your general field of view, FOV, when observing the live image on the software "Setup" screen. If you insert a very reflective sample, such as a smooth metal like gold, you can then direct the laser spot to the end of your cantilever. Make certain your probe is in the FOV, then focus on the reflective sample. Sometimes bringing the probe close to the surface of the sample will help in seeing the laser spot. Then watch the SUM. It should increase as the reflection of the laser hits the position sensitive detector. If you continue to have issues, feel free to connect with me on Zoom. I will be happy to walk you through the process. Best regards, Diana

    • @parthodas4219
      @parthodas4219 4 роки тому

      @@dianaconvey4527 Thank You very much !

  • @thomasizdebski3666
    @thomasizdebski3666 4 роки тому

    Great explanation and very straightforward!

  • @thauthentic
    @thauthentic 4 роки тому

    Nice. Very useful

  • @fatimaezzahrachakik5675
    @fatimaezzahrachakik5675 5 років тому

    please how to determine the crystal structure of the sample from High Score?

  • @luthfiyahrachmawati1473
    @luthfiyahrachmawati1473 5 років тому

    Hi, thank you for your nice video, it's very helpful. I just wanna ask , if I wanna take blank sample (ITO glass) so where is the place for blank sample?

    • @dianaconvey4527
      @dianaconvey4527 5 років тому

      Luthfiyah, if I understand you correctly, I believe you are asking where to put a reference sample. The reference port is located on the front side of the integrating sphere. In the video you might notice there is a reference standard used on that port when a reference sample is not used. I hope this answers your question. ~Diana

  • @neethuemmanuel7899
    @neethuemmanuel7899 5 років тому

    Hi, is it possible to measure the absolute optical power or intensity of the light falling on the sample in Lambda 950,?.

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 5 років тому

      Hi Neethu, The system is a dual beam instrument comparing the intensity between the 2 beams so there is no absolute measurement of the intensity only a relative one.

  • @jakefl0wers
    @jakefl0wers 6 років тому

    Strain and size analysis?

  • @dianaconvey4527
    @dianaconvey4527 6 років тому

    Odebowale I suggest checking out the information at J.A. Woollam's website. They have a very nice tutorial and offer classes on data analysis. Good luck

  • @odebowalealade9248
    @odebowalealade9248 6 років тому

    reaally enjoy the video. can you please send me reference material on WVASE Ellipsometry dataanalysis

  • @stellauget18
    @stellauget18 6 років тому

    im having having a hard time to interpret the results i got from XRD analysis. Please any help!

  • @rehanabibi3171
    @rehanabibi3171 7 років тому

    Hi Sir a useful video but i face some problems in my High plus software before i used it for many analysis but now as i did all of the step finally after selecting the target elements in the periodic table and click search so a message appear that no candidate found so plz tell me that what i should do, i reinstall but still not ok.

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 7 років тому

      I see that you saw my response below. You might need to contact PANalytical for help they have excellent customer service.

  • @kamal_abedin
    @kamal_abedin 7 років тому

    how much is it ?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 7 років тому

      I do not have the current price. Please contact the PANalytical sales office for pricing information.

    • @kamal_abedin
      @kamal_abedin 7 років тому

      how much was it ?

  • @hastivahidi6518
    @hastivahidi6518 7 років тому

    Hi, how are u? when I choose some possible elements and click search, I get this message: No candidates found. What is the problem?

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 7 років тому

      The issure can be a number of things. Make sure you have the PDF database on the computer you are using. If you are unsure of the elements present make sure they are selected in grey rather than green.

    • @rehanabibi3171
      @rehanabibi3171 7 років тому

      hi hasti have you solve the problem? i have the same problem as yours? by using the software ?

    • @hastivahidi6518
      @hastivahidi6518 7 років тому

      Hi thanks for your answer. I still have the same problem. I have PDF file on the the computer and I have imported them correctly because I can see the number of patterns which is a big one. but I still receive the same msg although I am sure about my the elements I chose

    • @hastivahidi6518
      @hastivahidi6518 7 років тому

      Hi how are u? I still have this problem:( did u find anything to solve it? let me know please and I will let you know too thanks

  • @nareshsarkar5646
    @nareshsarkar5646 7 років тому

    how to download this software, i am searched it so many time in google but it is not available trial version also.. kindly help me... my email id is ns.rathinonly4u@gmail.com

    • @EyringMaterialsCenter
      @EyringMaterialsCenter 7 років тому

      Hi Naresh, Please contact PANalytical, this program is sold by them.

  • @harryssamosir1094
    @harryssamosir1094 7 років тому

    how to download PANalytical X'Pert HighScore Plus? thanks