Electron Tube
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14.25. Lifetime of a chip
The reliability of microchips goes in phases. Behavior in early life is substantially different from that in useful life, and the wear out stage indicates the product is exiting the market. Understanding the features of each phase is important to the management of design goals.
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Відео

14.24. Reliability of VLSI systems
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Reliability is at once related to and distinct from testing. Reliability reflects on the behavior of a system or component over time. It is related to defects that accumulate or worsen over time. Some measure of unreliability is inevitable in VLSI.
14.23. Finding and solving dynamic hazards
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Dynamic hazards can be detected and solved from equations in a very similar way to static hazards. However, the entanglement of static and dynamic hazards must be approached very carefully because you might miss inadvertently miss some glitches.
14.22. Anatomy of dynamic hazards
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Dynamic hazards are much harder to discover and deal with than static hazards. However, once we realize that dynamic hazards are essentially transitions with an embedded static hazard, things start to get much better.
14.21. Static hazards in complex circuits
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We take a deeper look at how complicated logic circuits can be made glitch free. This requires a good understanding of how equations translate into differential paths through the circuit.
14.20. Static hazards in logic equations
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Using Karnaugh maps or logic circuits to detect and solve static hazards is not a scalable approach. As the number of input variables increase, K-maps become untenable. Fortunately, there are very easy ways to detect the possibility of glitches straight from logic equations.
14.19. Static-0 hazards
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Static-0 hazards are very similar to static-1 hazards. They come from very similar sources and are solved in very similar ways. However, because the stable zero at the output is a result of an AND gate instead of an OR gate, we must approach the problem a little differently.
14.18. Static-1 hazards
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Static-1 hazards occur when you expect the output of a circuit to remain stable at '1', but it temporarily glitches down to zero. This occurs due to differential delay through the circuit and is easily visible from Karnaugh maps.
14.17. Glitches and logical hazards
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Glitches are unexpected peaks and dips in logic outputs from combinational circuits. We would normally not care about the appearance of these glitches in synchronous pipelines, but in latch loops and asynchronous circuits they can be devastating.
14.16. Boundary scan & JTAG
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The boundary scan technique allows us to probe pins of chips connected to PCBs. The standard used to manage boundary scan is called JTAG. While boundary scan is mainly used to test copper tracks and soldering connections on PCBs, it can be combined with other DFT techniques to test individual chips.
14.15. PCB design & fabrication
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Printed Circuit Boards are used to combine multiple ICs with passive components to form a bigger system. The design and fabrication of PCBs has a lot of parallels to the design and fabrication of microchips, albeit much simpler and at much larger dimensions.
14.14. IC package types
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There are many IC package types to choose from. However, finding one that fits exactly to the needs of your die isn't always simple. There is always a tradeoff between simplicity and the number of pins you need, making it even more imperative that you have good pin economy.
14.13. IC packaging
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When you buy a microchip, it does not come as an exposed die. It comes in a tight little plastic container. This is the IC package, and for something so seemingly simple, we certainly expect it to do a whole lot of things.
14.12. Testing memories: coupling & NPSF
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Simple fault models like the stuck at fault model are a good starting point for representing memory faults. However, realistic models are significantly complicated by the fact that most memory faults involve interactions between multiple cells.
14.11. Testing memories: stuck at & transition faults
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Memories are designed with fundamentally unique metrics in mind. Thus, testing memories has to be different from testing random logic. Memories have one thing going for them: they have to do something very simple to be functional: write and read a '0', and write and read a '1'. But that is where the simplicity ends.
14.10. Built In Self Tests
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14.10. Built In Self Tests
14.9. Automatic Test Pattern Generation
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14.9. Automatic Test Pattern Generation
14.8. SCAN path technique
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14.8. SCAN path technique
14.7. SCAN registers
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14.7. SCAN registers
14.6. Stuck open/short fault model
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14.6. Stuck open/short fault model
14.5. Stuck at fault model
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14.5. Stuck at fault model
14.4. Yield, Defect Level, and Fault Coverage
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14.4. Yield, Defect Level, and Fault Coverage
14.3. Test Design and Fault Coverage
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14.3. Test Design and Fault Coverage
14.2. Defects, Faults, and Errors
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14.2. Defects, Faults, and Errors
14.1. Design for Testability
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14.1. Design for Testability
13.14. Asynchronous FIFOs
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13.14. Asynchronous FIFOs
13.13. Synchronizers & synchronization
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13.13. Synchronizers & synchronization
13.12. Statistics of metastability
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13.12. Statistics of metastability
13.11. Metastability
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13.11. Metastability
13.10. Clock distribution networks
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13.10. Clock distribution networks

КОМЕНТАРІ

  • @TheAhmedAbdulkadir
    @TheAhmedAbdulkadir 3 дні тому

    Thanks! Very informative

  • @luphiax4239
    @luphiax4239 17 днів тому

    how can you have only 7660 subscribers? You are amazing

  • @pallakishoreyadav4537
    @pallakishoreyadav4537 Місяць тому

    wont it be positive raising exponetial

  • @andreiamg8393
    @andreiamg8393 Місяць тому

    At 10:30 you say that If we hit the end of the process and there are transactions that did not turn into events they are canceled. - I think this is not correct in all cases. Example is a clock generation process that starts with the wait statement and then is the signal assignment.

  • @samaygoel707
    @samaygoel707 Місяць тому

    Beautiful explanation, Sir! Could you please provide practice practice questions with solutions?

  • @anupammathur17
    @anupammathur17 Місяць тому

    Very helpful video with precise and at depth content. Kudos to you sir!!

  • @shubhamnayak9369
    @shubhamnayak9369 Місяць тому

    Why register 5 is not a part of scan chain?

  • @wenshengchen1918
    @wenshengchen1918 Місяць тому

    I have a question: the faults discussed in this video seem like they don't appear at the same time, can ATPG and signature analyzer cover these multiple faults?

  • @youssefbahy7526
    @youssefbahy7526 2 місяці тому

    You are excellent

  • @youssefbahy7526
    @youssefbahy7526 2 місяці тому

    Great Explanaition

  • @vevekmanda6301
    @vevekmanda6301 2 місяці тому

    How can you take gamma as the same for jth and (j-1)th stage?

  • @vevekmanda6301
    @vevekmanda6301 2 місяці тому

    Fantastic explanation, an extremely underrated channel!

  • @adbanerjee9888
    @adbanerjee9888 2 місяці тому

    I have an intuitive understanding of why CLBs with inertial delays might block glitches with widths smaller than the inertial-delay width. The way I look at it is, if the inertial-delay time width is narrower than the glitch width, the sampling time will not even register the glitch as valid data. Is this a correct understanding? Also, is there a more quantitative explanation or resource to understand this further?

  • @rishithapulluru1082
    @rishithapulluru1082 2 місяці тому

    as always again a good video

  • @rishithapulluru1082
    @rishithapulluru1082 2 місяці тому

    hello sir i've a doubt.. can set up violation and hold violation be resolved after fabrication?

  • @rishithapulluru1082
    @rishithapulluru1082 2 місяці тому

    hello sir, first of all thank you for your huge efforts for making these videos and making it available for free for students seeking knowledge. I've a doubt about why storage node is at high impedence( at 8:45 ) if it is between curtoff transistors M5 and gate of M3, also previously also u mentioned in 4 transistor DRAM, while storing, Q node is high impedence node , dynamically high impedence node bcoz M1 is cutoff and M5 is cutoff , can you please elaborate on this?

  • @SumitKumar-tn5qz
    @SumitKumar-tn5qz 3 місяці тому

    G`H` ? If G or H is 1 then it will make additional product 0. but for GH = 01 10 00 the circuit should not have glitch

  • @mostafakassem9415
    @mostafakassem9415 3 місяці тому

    Best explanation of a process that I have ever encountered.👍

  • @gyulanagy5910
    @gyulanagy5910 5 місяців тому

    ua-cam.com/video/kxG83utFFDc/v-deo.html is AB.

  • @anirudhas1940
    @anirudhas1940 5 місяців тому

    I believe the label is necessary for instantiating because I am literally unable to instantiate components without labels. It gives me errors.

  • @yazanallahham4813
    @yazanallahham4813 6 місяців тому

    i dont usually comment but slutty explanation merci mon ami

  • @בןסגל-ו5צ
    @בןסגל-ו5צ 6 місяців тому

    so in your example function, if I want to take care of both dynamic hazard and static hazard (0->1->0 and 1->0->1) I need to multiply the specific problematic term in F like you said to fix the dynamic hazard (let's denote it now as F_tilde) and in addition I need to multiply F_tilde with the term that fix the 0 static hazard and then add the term that fix the 1 static hazard? so all in all we will get that F_fixed = F_tilde * (0 static hazard fix term) + (1 static hazard fix term)?

  • @belovedsandworm
    @belovedsandworm 6 місяців тому

    He just starts to introduce a Wallace Tree multiplier and immediately make two 'improvements.' It just adds confusion. Should stick to a simple example first, then note the improvements.

  • @inderjitsaini9303
    @inderjitsaini9303 7 місяців тому

    Hello There, Thank you for the explanation Sir. I am having a bit of an issue while simulating the Read Mode of a 6T SRAM Cell. So, I can successfully write the value into the Cell and check if they are retained when I put the Cell in Standby Mode (WL = 0). However, For the Read Mode, what I do is I pass Pulse signal of VDD to both BL and BL' for about 1.5 microseconds and then keep it low. Then, I try to turn on the WL at 2 microseconds but what ends up happening is that both Q and Q' values are same which oscillate between 0.268 and 0.832 V. So, Should I actually Use Capacitors in the Circuit when using Read Mode so that the Capacitors can be pre-charged?

  • @XGR_Tisa
    @XGR_Tisa 7 місяців тому

    Helpfull

  • @임재윤-e3j
    @임재윤-e3j 7 місяців тому

    thank you so much for the video. now i can fully understand the method.

  • @sravanforu
    @sravanforu 7 місяців тому

    One of the best lectures on metastability or probably the best explanation.

  • @josephhajj1570
    @josephhajj1570 7 місяців тому

    How to become a layout engineer

  • @shubhamnayak9369
    @shubhamnayak9369 7 місяців тому

    Very beautifully explained. Thanks for posting the videos professor.

  • @MoritzWallis
    @MoritzWallis 8 місяців тому

    Incredible videos, thank you so much. So well structured and easy to understand!

  • @tuannghia967
    @tuannghia967 8 місяців тому

    Thank you for your video. I always found it boring when I needed to read an explanation about the Wallace tree before. Therefore, I gave up before making an understanding of it.

  • @NostalgiaT
    @NostalgiaT 8 місяців тому

    whats the use of encoder and decoder, why do we use it?

  • @NostalgiaT
    @NostalgiaT 8 місяців тому

    whats the difference between asynchronous and sysnchrounos?

  • @uday7777777
    @uday7777777 9 місяців тому

    Very useful series. Thank you so much. It is helpful for my career

  • @alexandermuller8858
    @alexandermuller8858 9 місяців тому

    best and clearest explanation. I wish I knew that when I started with circuit design. It's so clear on point. Than you sir.

  • @yuezheng8128
    @yuezheng8128 9 місяців тому

    For the predecoder, if there is AND gate available, could we replace NAND+Inverter to AND, what's the pros and cons?

    • @chabetto
      @chabetto 7 місяців тому

      an AND is a NAND and an inverter - see the CMOS logic design

  • @birdinside28
    @birdinside28 10 місяців тому

    Simple and precise!

  • @fo.centuries
    @fo.centuries 11 місяців тому

    thankyou so much, great video

  • @can9977
    @can9977 Рік тому

    Hi, is cc'+c' or c'(c+c') also represents dynamic hazard like cc'+c or c(c+c')?

  • @gvcallen
    @gvcallen Рік тому

    Awesome video! Really thoroughly explained and I definitely learned a lot

  • @gvcallen
    @gvcallen Рік тому

    Not sure how I discovered this channel but your introduction was pin-point for me (an EE graduate with no FPGA knowledge). Thanks!

  • @nashatali6030
    @nashatali6030 Рік тому

    thanks for your effort Dr. Karim Abbas 👍

  • @Dg2020
    @Dg2020 Рік тому

    thank you very much. helped a lot

  • @vivekartist6893
    @vivekartist6893 Рік тому

    Your content is simple and fantastic! a lot of people are missing this out!

  • @frederikvanstolk5815
    @frederikvanstolk5815 Рік тому

    Couple questions. * When computing the setup and CQ times, shouldn't we take into account the charging time of the capacitor? Or is this implicitly part of the tI's and tT's? * At 9:21 you mention that the requirements on the 1--1 and 0--0 overlap are more stringent than in static CMOS, and hence racing is more of an issue. But is it really that stringent? Roughly speaking, you'd think that the overlap time is roughly the delay time tI of a single inverter, right? * In the series of RC's in 10:54 onwards, why are they all connected? Wouldn't the transmission gates be closed alternatingly?

  • @frederikvanstolk5815
    @frederikvanstolk5815 Рік тому

    Thank you for the wonderful lectures. I have a question about the cascaded network in 4:28 onwards. The PUN appear to receive an inverter clock signal. But would it not have been simpler to simply swap the tail nMOS and the head pMOS for a pMOS and nMOS respectively, and just give it an un-inverted clk?

  • @张扬-o4c
    @张扬-o4c Рік тому

    great video!!!

  • @8754484388
    @8754484388 Рік тому

    excellent tutorials , thank-you

  • @Rahulsharma-fo9fp
    @Rahulsharma-fo9fp Рік тому

    Great explaination sir..This 7 minute video made me subscribe ur channel

  • @kprahladareddy
    @kprahladareddy Рік тому

    Nice explanation | Helpful information ... Ty