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Hitachi Electron Microscope
Japan
Приєднався 17 чер 2019
Since 1939, Hitachi has developed and manufactured various electron microscopes including unique tabletop and ultrahigh voltage as well as SEM, TEM and FIB.
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www.hitachi-hightech.com/global/en/products/microscopes/
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www.linkedin.com/company/hitachi-electron-microscope/
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[Website]
www.hitachi-hightech.com/global/en/products/microscopes/
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www.linkedin.com/company/hitachi-electron-microscope/
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[Electronics] 50 kV Micro-XRF of an LED chip on SEM
An LED chip was analyzed using 50 kV Micro-XRF on SEM. Fluorescent matters (Sr, Y) in encapsulating medium, LED (Ga) and silver electrode (Ag) at a depth of 700 μm were clearly visualized in the Micro-XRF map.
Available tools for this measurement are :
SEM
www.hitachi-hightech.com/global/science/products/microscopes/electron-microscope/sem/su3800.html
Further details can be found on our membership website with data library. Looking forward to your joining.
biz.hitachi-hightech.com/sinavi/asi_applicationdetail?kijiId=AP021265&viewLanguage=en_US
About our membership site, see www.hitachi-hightech.com/global/science/guide/
#electronmicroscope
#electronmicroscopy
#scanningelectronmicroscope
#scanningelectronmicroscopy
Available tools for this measurement are :
SEM
www.hitachi-hightech.com/global/science/products/microscopes/electron-microscope/sem/su3800.html
Further details can be found on our membership website with data library. Looking forward to your joining.
biz.hitachi-hightech.com/sinavi/asi_applicationdetail?kijiId=AP021265&viewLanguage=en_US
About our membership site, see www.hitachi-hightech.com/global/science/guide/
#electronmicroscope
#electronmicroscopy
#scanningelectronmicroscope
#scanningelectronmicroscopy
Переглядів: 17
Відео
[Materials] Ultralow voltage imaging of Cellulose nanofibers
Переглядів 5114 днів тому
Cellulose nanofibers (CNFs) were observed at ultra-low accelerating voltage. The CNFs dispersed in water were dropped onto a silicon substrate with hydrophilicity treatment, spin-coated, and air-dried for the observation. The landing voltage was varied from 20 V to 500 V and the image with the highest contrast was obtained at 200 V. The CNFs observed at landing voltage of 200 V have sufficient ...
[Electronics] 3D visualization of a 176 layered 3D NAND
Переглядів 8528 днів тому
500 serial sectional SEM images of a 176 layered 3D NAND were acquired at 5 nm interval on an orthogonally arranged FIB-SEM. 11μm deep channel holes were uniformly processed from top to bottom and slits exhibit channeling contrast. After 3D reconstruction, x slice images exhibit the orthogonality of the channel holes and y slice images visualize the shape of the channel holes and the crystallin...
[Materials] High resolution crystal orientation mapping of a Cu wiring by TKD method
Переглядів 41Місяць тому
A plan view lamella of Cu wiring of CPU was prepared by in-situ lift out and thinned down to sub 100 nm. High resolution crystal orientation maps of the Cu wiring were subsequently obtained by Transmission Kikuchi diffraction (TKD) method on the FIB-SEM without exposing the sample to the atmosphere. Crystal orientation of a small grain with a width of 70 nm was identified. #CuWiring #CPU #lamel...
[Electronics] Accurate thinning of a 3D NAND using real-time STEM with single tilt holder
Переглядів 902 місяці тому
A lamella of a 3D NAND was accurately thinned on a FIB-SEM with the assistance of STEM and Single Tilt Holder. While cross-sectional SEM image of the lamella in the middle of thinning shows only the wirings exposed on the surface, STEM image reveals the buried wirings of depth. The lamella was thinned until the buried wirings were gone while observing the STEM image. Finally, the lamella was or...
[Materials] Low voltage SEM-EDX of a Fuel Cell Catalyst
Переглядів 542 місяці тому
A fuel cell catalyst was observed at the landing voltage of 300 V using beam deceleration. While the SE image visualized the aggregated structure of the carbon supports with topographic information, the BSE image showed a striking contrast between areas with compositional insight. Subsequent EDX analysis suggested the compositional difference between the carbon supports and the ionomer. #FuelCe...
[Life] Cooling BIB (Broad Ion Beam) cross sectioning of a Lotus corniculatus pulvinus
Переглядів 4373 місяці тому
A cross section of a Lotus corniculatus pulvinus was prepared by cooling BIB (Broad Ion Beam) milling to minimize ion beam induced thermal damage. The pulvinus motile cells seen as empty walls in the upper half of the low magnification image were sectioned without crushing. Chloroplasts with thylakoid membrane border and starch were observed in the high magnification image. # LotusCorniculatusP...
[Electronics] FIB cross-sectioning of an SRAM device with little curtaining
Переглядів 3043 місяці тому
A cross section of an SRAM device was prepared using FIB with little curtaining and observed by SEM at low accelerating voltage. FIB processing from directly above the sample surface caused curtaining due to the difference in etching rates of contact plug and other parts. Additional oblique FIB processing from two directions reduced the curtaining and produced a smooth surface to allow evaluati...
[Materials] High quality TEM lamella prep of InP (Indium Phosphide) using cryo-FIB
Переглядів 1373 місяці тому
A lamella of Indium Phosphide (InP) was prepared using cryo-FIB. While FIB process at RT left sub-10 nm precipitates on the surface and consequent curtaining artifacts even after 1 kV finishing, cryo FIB process at -120 °C reduced the diameter of the In crystal precipitates. Atomic resolution HAADF-STEM image obtained at RT FIB process showed partially bright background, whereas cryo-FIB produc...
[Materials] SEM-EDX analysis of As arsenic particles in Kuroko ores
Переглядів 1644 місяці тому
80 pieces of Kuroko, a kind of ore containing several hundred ppm of arsenic (As), were analyzed using SEM-EDX with CLEM (Correlative Light and Electron Microscopy) capability. EDX analysis and CLEM imaging of each piece enabled identification of ones with As particle aggregation. High magnification SEM-EDX with a STEM holder revealed the shape (spindle), size (1 μm or less ) and composition (c...
[SEM] The new TM4000Ⅱ / TM4000PlusⅡ Tabletop Microscope
Переглядів 7814 місяці тому
Check out our bestselling Tabletop Microscope ! For more details, visit www.hitachi-hightech.com/global/science/products/microscopes/electron-microscope/tabletop-microscopes/tm4000ii.html #electronmicroscope #electronmicroscopy #scanningelectronmicroscope #scanningelectronmicroscopy
[Life] SEM-EDX analysis of environmental dusts
Переглядів 3595 місяців тому
A kind of sand dusts and that of volcanic ashes were analyzed using SEM-EDX. They were observed at low accelerating voltage and analyzed in low vacuum without sample coating. Both consist of silica (SiO2) and alumina (Al2O3) and EDX analysis cannot tell the difference, whereas SE images revealed the difference in the surface structure between the two. #SandDust #VolcanicAsh #SEM #EDX #ElectronM...
[Life] Low magnification SEM of“Ionic Liquid”-treated biological samples
Переглядів 1005 місяців тому
“Ionic Liquid”-treated biological samples were observed using large chamber SEM capable of low magnification imaging at long working distance. A species of microcrustacean, a brine shrimp, treated with 5% IL1000 (Ionic Liquid) and a broccoli flower fixed with glutaraldehyde and immersed in 5% IL1000 were observed without shrinkage or destruction. #Microcrustacean #Shrimp #Broccoli #IonicLiquid ...
[Materials] STEM-in-SEM of Kaolin particles
Переглядів 4325 місяців тому
Kaolin particles used for porcelain were observed on a tungsten SEM equipped with a STEM detector. Secondary electron images gave an overview of a secondary particle and its surface profile. STEM images of dispersed primary particles showed detailed shapes with even their inner structures at high magnification. EDX maps visualized the distribution of principal elements (Al & Si) and even a fine...
[Materials] In-situ TEM of a sulfide-based all solid-state-battery
Переглядів 2686 місяців тому
The deterioration process of a sulfide-based all-solid-state battery reaction under air atmosphere was observed using in-situ TEM. The sample was extracted from the interface between the cathode and the solid electrolyte and thinned with an FIB-SEM, avoiding exposure to the air through the entire process from sample preparation to TEM observation by using an Air Protection FIB-TEM linkage holde...
[Materials] Automated particle analysis of SiO2 slurry
Переглядів 2076 місяців тому
[Materials] Automated particle analysis of SiO2 slurry
[Materials] Ultra-low voltage SEM of Fuel Cell Ionomer
Переглядів 5297 місяців тому
[Materials] Ultra-low voltage SEM of Fuel Cell Ionomer
[Materials] TEM of carbon nanomaterials
Переглядів 8418 місяців тому
[Materials] TEM of carbon nanomaterials
[Materials] Aberration Corrected STEM of single atom doped perovskite KCa2Nb3O10 crystal nanosheets
Переглядів 2648 місяців тому
[Materials] Aberration Corrected STEM of single atom doped perovskite KCa2Nb3O10 crystal nanosheets
[Materials] Magnetic domain observation of a Samarium-cobalt magnet
Переглядів 1979 місяців тому
[Materials] Magnetic domain observation of a Samarium-cobalt magnet
[Materials] Intermittent flat ion milling of Leaded Solder
Переглядів 739 місяців тому
[Materials] Intermittent flat ion milling of Leaded Solder
[Life] TEM observation of rat cerebral cortex infected with swine coronavirus
Переглядів 1079 місяців тому
[Life] TEM observation of rat cerebral cortex infected with swine coronavirus
[Electronics] 3D structural analysis of a 7 nm process nodes SRAM
Переглядів 40610 місяців тому
[Electronics] 3D structural analysis of a 7 nm process nodes SRAM
[Life] TEM of Rat Alveolar Epithelium
Переглядів 14010 місяців тому
[Life] TEM of Rat Alveolar Epithelium
[Materials] SEM/EDX analysis of a combustion sensor electrode
Переглядів 15811 місяців тому
[Materials] SEM/EDX analysis of a combustion sensor electrode
[Materials] High resolution SEM/EDX of a water splitting photocatalyst
Переглядів 11811 місяців тому
[Materials] High resolution SEM/EDX of a water splitting photocatalyst
[Materials] Ultra-low-voltage SEM of LIB anode material
Переглядів 140Рік тому
[Materials] Ultra-low-voltage SEM of LIB anode material
[Materials] SEM-EDX analysis of a 12th century Antique Persian Pottery
Переглядів 151Рік тому
[Materials] SEM-EDX analysis of a 12th century Antique Persian Pottery
[Materials] Accurate surface roughness evaluation using SEM and CSI
Переглядів 166Рік тому
[Materials] Accurate surface roughness evaluation using SEM and CSI
[Electronics] Automated TEM lamella preparation including Ar ion beam finishing
Переглядів 415Рік тому
[Electronics] Automated TEM lamella preparation including Ar ion beam finishing
and which cutter did you use to make the cross section of battery?
How did you set battery material in SEM instrument?
Hi, Please I have been trying to reach someone from the company and then I came across this video. I am using the SEM Tm 3030 for my dissertation and I want to get the thickness of film on a cellulose paper by checking the cross section. Please how do I use SEM to find cross section measurement so I can calculate the film thickness.
What is the tension used for ion milling ?
Awesome 😊
I made a much better cross section by hand where the bond wire from the cathode to the anode remains electrically intact and is preserved for further testing.
Impressive BFSTEM!
cool
These damn marbles. The cause and the solution of all worlds problems
Suspended levels…sweet.
I asked Google Gemini Ultra why this is interesting. Here is what it came up with: Key Points of Interest Precision Doping on the Atomic Scale: This work demonstrates the controlled substitution of single Nb atoms with Pt, Pd, and Ru within the perovskite lattice. Such atomic-level engineering opens the door to finely tuning fundamental material properties with implications for electronics, optoelectronics, and catalysis. Layered Perovskite Nanosheets: The focus on KCa2Nb3O10 in its nanosheet form introduces interesting dimensional effects. Perovskites are already renowned for their desirable properties, and exploring them in 2D systems could reveal novel physics and potential device applications. Direct Structural Characterization: The use of aberration-corrected STEM allows for unambiguous visualization of the dopant atoms within the perovskite lattice. This direct confirmation of structural modification is crucial for correlating materials design with resultant properties. Potential Implications While the direct focus of this research is on structural characterization, its findings lay a strong foundation for future investigations into: Tailored Electronic and Optical Properties: Precise dopant placement could yield significant enhancements in conductivity, carrier mobility, or light absorption/emission within these perovskite nanosheets. Emergent Phenomena in 2D Systems: Explorations in layered perovskites could uncover exotic electronic states or magnetic ordering phenomena with unique technological potential. Advanced Catalysis: Atomic-level understanding of active sites created by dopant elements might enable the design of highly efficient and selective catalysts. Edit: This video talks about solar panels based on Perovskite: ua-cam.com/video/RMcPiCyz2Xg/v-deo.html
Promo>SM 😞
Promo SM 😘
This is a great application for the ArBlade, as it would save tons of sample prep or FIB milling time trying to expose the AOI.
what are the concentric patterns? TSV? would you please also load cross-sectional images?
Thanks for your comment. They are channel holes of 3D NAND flash memory. Please check following video. ua-cam.com/video/OXXWiZtFNKQ/v-deo.html
this is beautiful!
How was prepared the sample?
please, show us this virus
Nice 👍
Nice 😊
Interesting 🤨
Nice & thanks for sharing
3u0yf vun.fyi
thank you
cool. thanks
,I'm
What is the HV used for EDX ?
5 kV with X-Max Extreme windowless SDD.
Hitahi is Origiranl SEM Manufacturer... #Nanotechdigitalgmbh #tabletopsem #www.nanotechdigitalgmbh.com
May I ask you a question about a type of photoresist
Thanks for your interest. You mean the photoresist shown in other video ?
@@hitachielectronmicroscope9795 basically I want To Know If All types of photoresist liquid either being positive or negative like the two mentioned in this article www.nature.com/articles/s41378-018-0016-3 are Just the same substance or different photoresist liquids but most importantly the two types by a single one purpose for the purpose of the article. Thanks for answering the question
@@hitachielectronmicroscope9795 the article is big so it is at page 3 of the pdf www.nature.com/articles/s41378-018-0016-3 And also maybe if I replace is that foldable material and instead I just do it on a glass like in this video m.ua-cam.com/video/Wun-nTJqqFM/v-deo.html it would be more easier and more straightforward just taking one photoresist liquid Thanks I wait for your answer
@@hitachielectronmicroscope9795 hello, I mean in The article